器件名称: AXX3225L
功能描述: Quartz Crystal Unit in SMD package 3.2x2.5 mm Low frequency version operating in
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简 介:Specification Oscillator type :
Issue: 01 Date: 2006-03-18 AXX3225L Quartz Crystal Unit in SMD package 3.2x2.5 mm Low frequency version operating in “Lame” contour mode RoHS compliant
Parameter
Frequency range Actual frequency f0 Crystal cut / Vibration mode Load capacitance CL Adjustment tolerance Frequency stability Frequency stability over temperature range operating temperature range (steady state) long term (aging) Resonance resistance Rr Motional capacitance C1 Static capacitance C0 Drive level Insulation resistance Storage temperature range Enclosure (see drawing) marking
min. typ. max. Unit
3 5 MHz MHz GT / Lame mode 10 ~ 50 pF or Series -30 +30 +10 ~ -50 -10 +60 ±5 500 150
Condition
IEC 60286-3 Packing Notes: 1. Overall frequency stability = initial tolerance + temp. stability + aging (1st year) 2. Terminology and test conditions are according to IEC standard IEC60122-1, unless otherwise stated 3. Measurement technique according to IEC 60444-5 or equivalent
20 200 500 -40 +85 3.2 x 2.5 x 0.7 Frequency (MHz) + Date Code Tape & Reel
ppm ppm ppm °C ppm fF pF W M °C
@ 25°C +-5°C Overall (Note 1) See chart for typical f(T) characteristic @ 3 MHz @ 5 MHz
100 V DC IEC 61637
Typical Frequency vs. Temperature Characteristic
GmbH & Co. KG Wasemweg 5 D-74821 Mosbach Germany
AXX3225L page 1(2)
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Enclosure drawing
Environmental conditions
Test Visual inspection, dimensions Sealing t……
